The ability to accurately measure films thicknesses and their properties, to perform accurate surface profiling and to effect quantitative measurement of the reflection or transmission properties of a material as a function of wavelength are all important steps in the research and manufacturing of advanced materials and industrial devices. 

Metrology & Profiling

Thin Films, Metrology and Profiling 

Stress Analysis

Nuclear magnetic resonance Spectrometer (NMR)

Micro XRF

Our Field Of Expertise
And Products: