Scanning Electron Microscopes (SEM) are used for inspecting topographies of materials with a magnification range that encompasses that of optical microscopy and extends it to the nanoscale.
Transmission Electron Microscopes (TEM) use high-voltage electron beams to acquire ultra-high resolution sample images down to sub-Ångström levels for analyzing the atomic structure, crystallographic structure and composition of specimens.
Our Surface Analysis product line is comprised of three categories: Auger Microanalyzers, Electron Probe Microanalyzers (EPMA), and Photoelectron Spectrometers.Our complete product line enables detailed surface chemical characterization, nano-scale feature analysis, and thin film characterization.
