Nanonis Multiprobe Control System
Multi-probe experiments have gained substantial importance over the past few years. Several companies offer systems equipped with two, four, or even more probes to investigate a sample. In many cases an additional scanning electron microscope helps to adjust the relative position of the tips. However, the results that can be achieved today with these systems are often limited by the means
to control the instrument. To solve these issues and provide the research community with an easy way around these limitations, SPECS has continued developing the Nanonis SPM control system to handle multi-probe systems.

Your Needs