Toho HL9900
Hall Effect Measurement

HL9900 is a turnkey, high performance hall effect system for the measurement of resistivity, carrier concentration, and mobility in semiconductors. Modular in concept, allowing easy upgrade paths, the system is suitable for a wide variety of materials, including silicon and compound semiconductors. HL9900 has both low and high resistivity measurement capabilities. With an intuitive user interface, no programming experience is required to set up or use the HL9900.

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