A traditional approach to finding shorts in semiconductor devices has been liquid crystal investigation. Unfortunately, liquid crystal investigations have several limitations: low sensitivity (especially from the backside), slow response, operator exposure to bio-hazardous materials, difficulties with application and interpretation. QFI’s Thermal-HS medium wave infrared (MWIR) hot spot sensor locates ohmic faults from their self-heating. Heat radiates in the infrared spectral range, and the QFI’s MWIR sensors are capable of capturing these radiant emissions.
