X'Pert³ MRD XL
The long and successful history of Malvern Panalytical's Materials Research Diffractometers (MRD) continues with the generation of X’Pert³ MRD XL. The improved performance and reliability of the new platform have added more analytical capability and power for X-ray scattering studies in: 

• advanced materials science 
• scientific and industrial thin film technology 
• metrological characterization in semiconductor process development

The X’Pert³ MRD XL handles wide range of applications with full wafer mapping up to 200 mm.

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