ASTAR - TEM Orientation Imaging
Materials science properties (metals, alloys, ceramics, semiconductors, nanoparticles) depend  on great  extent  on their textures  at nm scale level. ASTAR device uses TEM based orientation mapping technique (EBSD-TEM like) based on collection of precession electron diffraction (PED)  patterns and cross-correlation  comparison with simulated  intensities.
ASTAR can turn any TEM into a very powerful analytical tool enabling orientation–phase imaging at 1 nm resolution attainable (FEG TEM) in combination with other TEM analytical techniques.

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