JAMP-9500F Field Emission Auger Microprobe
The JAMP-9500F offers the highest spatial resolution available in a microprobe: (min. probe diameter of 3nm SEI; 8nm for Auger analysis). Employing a low-aberration condenser lens (in which an electrostatic field and a magnetic field are superposed), combined with a patented "in-lens" Schottky field emission gun, the JAMP-9500F obtains very small spot sizes with beam currents up to 200nA.

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