The long and successful history of Malvern Panalytical's Materials Research Diffractometers (MRD) continues with the generation of X’Pert³ MRD XL. The improved performance and reliability of the new platform have added more analytical capability and power for X-ray scattering studies in:
• advanced materials science
• scientific and industrial thin film technology
• metrological characterization in semiconductor process development
The X’Pert³ MRD XL handles wide range of applications with full wafer mapping up to 200 mm.