IRLC IR Laser Scanning Confocal Microscope
In response to the demands of semiconductor manufacturers for an instrument capable of imaging within a wafer or device in a non-destructive manner, WDI designed and manufactured an automated Infrared Laser Confocal Microscope (IRLC). The IRLC allows subsurface and interior inspection of silicon wafers and devices, permitting the imaging of internal structures at sub-micron resolution.

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