IB-19500CP - Cross Section Polisher (CP) 
A Cross Section Polisher (hereinafter, “CP”) is a device to prepare pristine cross sections of a specimen for a scanning electron microscope (SEM), electron probe micro analyzer (EPMA), or Auger micro probe.

Employing a new method of using a broad Ar+ ion beam and shielding plate, has made it possible to produce cross sections free of artifacts and distortion with less time and skill required than the preceding methods.

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